4/16/23: Waveguide-Based THz Standards and Metrology
In a recent publication VDI CTO Jeffrey Hesler and colleagues Xiaobang Shang and Nick Ridler— from the National Physical Laboratory, UK—comment on the present state of THz metrology, specifically as it relates to the use of waveguides. Noteworthy challenges facing the industry are incompatible waveguide interface designs from manufacturers and a deficiency in traceable power standards above 110 GHz, among others. Given the excitement around THz communications and 6G technology, there are a number of solutions and advancements actively being pursued to overcome these obstacles and establish industry-wide standards for waveguide based metrology. Check out the article for a more comprehensive discussion.
Contact VDI here.